This study proposes a method of studying and modeling the dielectric absorption in capacitors. Dielectric absorption is a well known phenomenon in capacitors which manifests as a slow recovery of a part of its lost voltage after the capacitor is completely discharged by shorting its terminals momentarily.
An increase in voltage across a capacitor after a brief short circuit can be explained by the dielectric releasing absorbed charges back to the electrodes. Currents and voltages related to these processes can be defined as absorption currents and absorption voltages, respectively.
In addition to the resistive non-idealities of inductors there could also be capacitive effects. These effects usually become important at high frequencies. Unless stated otherwise, these effects will be neglected in out analysis. The inductance L represents the efficiency of storing magnetic flux.
In technical literature, the phenomenon of voltage recovery is often referred to as the dielectric absorption (DA). Absorption processes are well known in a variety of dielectric materials employed in different types of capacitors, including MLCCs [2-4].
The absorption capacitance was calculated as a ratio of the charge, Qt, that is transferred into the dielectric during polarization and applied voltage, Ct = Qt/V. The value of Qt was calculated by integrating of the absorption current with time of polarization.
AC capacitors are also utilized in power factor correction circuits where they supply leading reactive power (KVAR) to correct the lagging current caused by inductive loads. The circuit is said to be running at unity power factor if the capacitive reactance of the applied capacitors exactly matches the inductive reactance of the load.