Thin film photovoltaic (PV) technologies often utilize monolithic integration to combine cells into modules. This is an approach whereby thin, electronically-active layers are deposited onto inexpensive substrates (e.g. glass) and then interconnected cells are formed by subsequent back contact processes and scribing.
A flexible 85 × 80 mm 2 Cu (In,Ga)Se 2 mini-module composed of 17 series-connected solar cells on a curved surface was characterized experimentally and theoretically. We found that the short-circuit current of the curved PV module is affected by all the solar cells connected in series and is not simply determined by the current-limiting solar cell.
We found that the short-circuit current of the curved PV module is affected by all the solar cells connected in series and is not simply determined by the current-limiting solar cell. The current-voltage characteristics of a curved PV module are well described by a simple model that includes low shunt resistance.
The electric potential difference causes leakage currents to flow from the module frame to the solar cells (or vice versa, depending on the module position in a module string), which results in PID.
Any short-circuit operation of a thin-film module shall be avoided. Due to the production tolerance in cell performances, reverse biased operation of cells with low Isc will occur and lead to module damages. In particular, this issue shall be considered by calibration labs if continuous light source or natural sunlight is used for measurements.
The glass cover of some PV modules may break or cells in the laminate may break due to vibrations and shocks. In the former case it is easy to attribute the glass breakage to the transportation or installation. This is clearly no PV module failure. However, the cause of cell breakage is much more difficult to decide.